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Publikationen

A 0.5 V, 1µW successive approximation ADC

J. Sauerbrey, D. Schmitt-Landsiedel, and R. Thewes

pp. 247-250, 2002. Conference Location: Florence, Italy



Yield evaluation of gold sensor electrodes used for fully electronic DNA detection arrays on CMOS

Frey, F. Hofmann, R. Peters, B. Holzapfl, M. Schienle, C. Paulus, P. Schindler-Bauer, D. Kuhlmeier, J. Krause, G. Eckstein, and R. Thewes

Volume: 42 (9) pp. 1801-1806, 2002.


Sensor arrays for fully electronic DNA detection on CMOS

R. Thewes, F. Hofmann, A. Frey, B. Holzapfl, M. Schienle, C. Paulus, P. Schindler, G. Eckstein, C. Kassel, M. Stanzel, R. Hintsche, E. Nebling, J. Albers, J. Hassman, J. Schülein, W. Goemann, and W. Gumbrecht

Volume:1 pp. 350-351 and 472-473, 2002. Conference Location: San Francisco, CA, USA


Passive DNA sensor with gold electrodes fabricated in a CMOS backend process

F. Hofmann, A. Frey, B. Holzapfl, M. Schienle, C. Paulus, P. Schindler-Bauer, R. Hintsche, E. Nebling, J. Albers, W. Gumbrecht, and R. Thewes

pp. 487-490, 2002.


Ultra low-voltage MOSFET-only switched-opamp ΣΔ modulators using depletion-mode MOS-capacitors

T. Tille, J. Sauerbrey, R. Thewes, and D. Schmitt-Landsiedel

pp. 587-590, 2002. Conference Location: Florence, Italy


Fully electronic DNA detection on a CMOS chip: device and process issues

F. Hofmann, A. Frey, B. Holzapfl, M. Schienle, C. Paulus, P. Schindler-Bauer, D. Kuhlmeier, J. Krause, R. Hintsche, E. Nebling, J. Albers, W. Gumbrecht, K. Plehnert, G. Eckstein, and R. Thewes

pp. 488-491, 2002. Conference Location: San Francisco, CA, USA


Polymer gate dielectric pentacene TFTs and circuits on flexible substrates

H. Klauk, M. Halik, U. Zschieschang, G. Schmid, W. Radlik, R. Brederlow, S. Briole, C. Pacha, R. Thewes, and W. Weber

pp. 557-560, 2002. Conference Location: San Francisco, CA, USA


A 0.7V MOSFET-only switched-opamp sigma-delta modulator in standard digital CMOS technology

J. Sauerbrey, T. Tille, D. Schmitt-Landsiedel, and R. Thewes

Volume:37 (12) pp. 1662-1669, 2002.


Precise characterization of long distance mismatch of CMOS devices

U. Schaper, C. Linnenbank, and R. Thewes

pp. 311-317, 2001.


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