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Publikationen

Low frequency noise of integrated poly-silicon resistors

R. Brederlow, W. Weber, C. Dahl, D. Schmitt-Landsiedel, and R. Thewes

Volume:48(6)pp. 1180-1187, 2001.


Evaluation of the impact of mechanical stress on CMOS device mismatch

U. Schaper, C. Linnenbank, U. Kollmer, H. Mulatz, R. Schmidt, R. Tilgner, and R. Thewes

pp. 1-5, 2001. Conference Location: Kobe


Ultra low voltage switched opamp SD modulator for potable applications

J. Sauerbrey and R. Thewes

pp. 35-38, 2001. Conference Location: San Diego, CA



Evaluation of MOSFET reliability in analog applications

R. Thewes, R. Brederlow, C. Schlünder, P. Wieczorek, B. Ankele, A. Hesener, J. Holz, S. Kessel, and W. Weber

. . pp. 73-80, 2001.


Mismatch of MOSFET small signal parameters under analog operation

R. Thewes, C. Linnenbank, U. Kollmer, S. Burges, U. Schaper, R. Brederlow, and W. Weber

Volume:21 (12) pp. 552-553, 2000.


Effect of parameter variations at chip and wafer level on clock skews

S. Sauter, D. Schmitt-Landsiedel, R. Thewes, and W. Weber

pp. 395-400, 2000.


On the design robustness of threshold logic gates using multi-input floating gate MOS transistors

A. Luck, S. Jung, R. Brederlow, R. Thewes, K. Goser, and W. Weber

Volume: 47(6)pp. 1231-1240, 2000.


A novel approach for precise characterization of long distance mismatch of CMOS devices

U. Schaper, C. Linnenbank, and R. Thewes

pp. 148-152, 2000.


On the matching behavior of MOSFET small signal parameters

R. Thewes, C. Linnenbank, U. Kollmer, S. Burges, M. DiLeo, M. Clincy, U. Schaper, R. Brederlow, R. Seibert, and W. Weber

pp. 137-141, 2000.


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