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Publikationen

Measurement and simulation of interconnect capacitance values

S. Sauter, A. Rein, M. Frerichs, D. Schmitt-Landsiedel, R. Thewes, and W. Weber

S. Sauter, A. Rein, M. Frerichs, D. Schmitt-Landsiedel, R. Thewes, and W. Weber. Measurement and simulation of interconnect capacitance values. Proc. Fifth International Workshop on Statistical Metrology 2000.


MOS Transistor reliability under analog operation

R. Thewes, R. Brederlow, C. Schlünder, P. Wieczorek, B. Ankele, A. Hesener, J. Holz, S. Kessel, and W. Weber

Volume: 40( 8–10)pp. 1545-1554, 2000.


Area optimization of analog circuits considering matching constraints

C. Paulus, U. Kleine, and R. Thewes

p. 145, 2000.


Linearization method for fast voltage-to-current converters

C. Paulus and R. Thewes

pp. 144-145, 2000. Conference Location: Honolulu, HI, USA


A low-Power and high-performance CMOS fingerprint sensing and encoding architecture

S. Jung, R. Thewes, T. Scheiter, K. Goser, and W. Weber

Volume:34 (7) pp. 978-984, 1999.


Precise quantitative evaluation of the hot-carrier induced drain series resistance degradation in LATID-n-MOSFETs

G. H. Walter, W. Weber, R. Brederlow, R. Jurk, C.G. Linnenbank, C. Schlünder, D. Schmitt-Landsiedel, and R. Thewes

Volume: 38 (6-8) pp. 1063-1068, 1999.


Channel length dependence of hot-carrier degradation of LATID-n-MOSFETs under analog operation

R. Thewes, G. H. Walter, R. Brederlow, C. Schlünder, A. v. Schwerin, R. Jurk, C. G. Linnenbank, G. Lengauer, D. Schmitt-Landsiedel, and W. Weber

pp. 233-238, 1999.


Hot-carrier degradation of the low frequency noise of MOS transistors under analog operating conditions

R. Brederlow, W. Weber, D. Schmitt-Landsiedel, and R. Thewes

pp. 239-242, 1999.


Intelligent CMOS fingerprint sensors

S. Jung, C. Hierold, T. Scheiter, P.-W. v. Basse, R. Thewes, K. Goser, and W. Weber

pp. 966-969, 1999.


Clock skew determination from parameter variations at chip and wafer level

S. Sauter, D. Cousinard, R. Thewes, D. Schmitt-Landsiedel, and W. Weber

pp. 7-9, 1999. Conference Location: Kyoto


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