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R. Thewes, M. Brox, G. Tempel, W. Weber, and K. Goser
Volume: 13 pp. 590-592, 1992.
R. Thewes, M. Brox, G. Tempel, W. Weber, and K. Goser. Hot-carrier degradation of p-MOSFET's in analog operation: the relevance of the channel-length-independent drain conductance degradation. Tech. Digest International Electron Device Meeting (IEDM) 1992. San Francisco, CA
W. Weber, M. Brox, A. v. Schwerin, and R. Thewes
Volume: 22 (1-4) pp. 253-260, 1993. Amsterdam, The Netherlands, The Netherlands
R. Thewes, W. Weber, and K. Goser
pp. 85-88, 1993. Conference Location : Grenoble
R. Thewes, M. Kivi, K. Goser, and W. Weber
pp. 127-130, 1994.
R. Thewes, K. Goser, and W. Weber
pp. 303-306, 1994. Conference Location : San Francisco, CA, USA
W. Weber, M. Brox, R. Thewes, and N. S. Saks
pp. 311-314, 1994. Conference Location : San Francisco, CA
S. A. Kühn, M. B. Kleiner, R. Thewes, and W. Weber
1 pp. 37-40, 1995. Conference Location: Seattle, WA
S. A. Kühn, R. Thewes, M. B. Kleiner, and W. Weber
pp. 350-353, 1995. Conference Location: Lille, France
M. Eisele, J. Berthold, R. Thewes, E. Wohlrab, D. Schmitt-Landsiedel, and W. Weber
pp. 67-70, 1995. Washington, DC
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